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Spearheaded the integration of quality and reliability programs into the NPI process, achieving ISO certifications and securing major accounts.
Led the development of reliability programs for Lithium-Ion battery systems, ensuring compliance with industry standards and optimizing product life estimates.
Implemented yield improvement programs and managed supplier quality for Lithium-Ion battery systems, achieving significant manufacturing yield improvements.
Directed the development of reliability programs for LED-based light bulbs, achieving savings in budget and optimizing product testing methodologies.
Harmonized and led corporate product reliability and quality programs, achieving significant cost savings and streamlining qualification processes.
Contributed to the thermal design of transponder systems and executed reliability programs to meet industry standards.
Directed R&D activities for reliability tests on disk drive storage systems, securing funds for state-of-the-art test labs and achieving cost savings.
Established a comprehensive reliability and qualification program for personal computers and facilitated a successful transition to stress screening methodology.
AWARDS
Significant Contribution and Employee Achievement Award (1991) Digital Equipment Corporation
Reliability and Quality Teaching Award (1990) Digital Equipment Corporation
Significant Contribution Employee Award (1996) and (1998), Quantum Corporation
SELECTED LIST OF PUBLICATIONS (NOT ALL)
1. Wearout Evaluation of Soldered Interconnections for Surface Mounted Leadless and Leaded Components, By J. Seyyedi and S. Jawaid, Digital Equipment Corporation, published in Soldering and Surface Mount Technology Journal of the SMART (Surface Mount Related Technologies) Group, Number 4, February 1990.
2. Linear Ramp Chambers & Thermal ESS, By Shams Jawaid, Kevin Crook, EE-Evaluation Engineering, June 1992.
3. Disk Drive Reliability and Thermal Management, By Shams Jawaid, Component Reliability Engineering
Manager, Quantum Corporation, published in Electronic Cooling, Volume 4, Number 3, September 1998.
4. Accelerated Reliability Test: Solder Defects Exposed, By Shams Jawaid and Tom Nesbitt, Quantum Corporation, IEEE, Annual Reliability & Maintainability Symposium, proceedings January 1999. Presented by Shams Jawaid.
5. Design-Evaluation and Product Reliability Assessment Using Accelerated Fatigue Life Tests, By Shams Jawaid and Jon Ferguson, Quantum Corporation, IEEE Annual Reliability and Maintainability Symposium, January 2000.
6. Accelerated Vibration Test Effectiveness Dependence on Test Equipment Performance Limits and Product Response, by Shams Jawaid and Phillip Rogers, Quantum Corporation & UDC, IEEE, Annual Reliability & Maintainability Symposium, proceedings January 2000. Speakers S.Jawaid/Phillip Rogers at the RAMS 2000.
7. Reliability Stress Test Method: Impact on the New Product Introduction Process, Time to Market, Field Reliability Impact & Reliability Assessment. Shams Jawaid, Seifi Zaki, & Jon Ferguson Harmonic Inc., IEEE RAMS 2002.
